DFT interview Preparation

You are here:

DFT Interview

  • Scan Insertion, need of scan insertion, scan DRCs, clearing Scan DRCs.
  • Scan Compression, need of scan compression, EDT architecture, deciding no. of internal chains and external channels.
  • Need of ATPG, fault simulation, fault classes, fault categories, fault models (SA, TDF, IDDQ, PDF), On-chip Clock Controller (OCC), different types of patterns, coverage analysis and improvement.
  • Simulations, it’s need and simulation mismatch debug.
  • JTAG, it’s need, TAP architecture, JTAG FSM, Boundary Scan.
  • IJTAG architecture, advantage of IJTAG over JTAG
  • Memory faults, algorithms, Tessent MBIST implementation and Architecture.
  • Hierarchical Scan, Scan Wrappers.
  •  
  • Scan Insertion, need of scan insertion, scan DRCs, clearing Scan DRCs.
  • Scan Compression, need of scan compression, EDT architecture, deciding no. of internal chains and external channels.
  • Need of ATPG, fault simulation, fault classes, fault categories, fault models (SA, TDF, IDDQ, PDF), On-chip Clock Controller (OCC), different types of patterns, coverage analysis and improvement.
  • Simulations, it’s need and simulation mismatch debug.
  • JTAG, it’s need, TAP architecture, JTAG FSM, Boundary Scan.
  • IJTAG architecture, advantage of IJTAG over JTAG
  • Memory faults, algorithms, Tessent MBIST implementation and Architecture.
  • Hierarchical Scan, Scan Wrappers.
CourseDFT Interview Preparation
FeeE-learning mode 8,000+ 18%GST
Next Batch
Course Highlights
  • 1-1 Dedicated Mentor Support
  •  24/7 Tool Access
  • Multiple mock interviews
  • Industry Standard Projects
  • Support with resume update