DFT Interview
Course Summary
- Scan Insertion, need of scan insertion, scan DRCs, clearing Scan DRCs.
- Scan Compression, need of scan compression, EDT architecture, deciding no. of internal chains and external channels.
- Need of ATPG, fault simulation, fault classes, fault categories, fault models (SA, TDF, IDDQ, PDF), On-chip Clock Controller (OCC), different types of patterns, coverage analysis and improvement.
- Simulations, it’s need and simulation mismatch debug.
- JTAG, it’s need, TAP architecture, JTAG FSM, Boundary Scan.
- IJTAG architecture, advantage of IJTAG over JTAG
- Memory faults, algorithms, Tessent MBIST implementation and Architecture.
- Hierarchical Scan, Scan Wrappers.
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- Scan Insertion, need of scan insertion, scan DRCs, clearing Scan DRCs.
- Scan Compression, need of scan compression, EDT architecture, deciding no. of internal chains and external channels.
- Need of ATPG, fault simulation, fault classes, fault categories, fault models (SA, TDF, IDDQ, PDF), On-chip Clock Controller (OCC), different types of patterns, coverage analysis and improvement.
- Simulations, it’s need and simulation mismatch debug.
- JTAG, it’s need, TAP architecture, JTAG FSM, Boundary Scan.
- IJTAG architecture, advantage of IJTAG over JTAG
- Memory faults, algorithms, Tessent MBIST implementation and Architecture.
- Hierarchical Scan, Scan Wrappers.
Course | DFT Interview Preparation |
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Fee | E-learning mode 8,000+ 18%GST |
Next Batch |
Course Highlights
- 1-1 Dedicated Mentor Support
- Â 24/7 Tool Access
- Multiple mock interviews
- Industry Standard Projects
- Support with resume update